HAXIS Low-angle Ion Milling Scanning Electron Microscope. Background of development. As advanced semiconductor device str ...

The argon-based system combines low-angle ion milling with voltage-contrast imaging. JEOL targets annual sales of 15 systems.

JEOL Ltd. announced the development of its new low-angle ion-milling scanning electron microscope, HAXIS, and will commence sales on October 5, 2026. HAXIS is JEOL's new semiconductor failure analysis ...

Researchers have identified an electron-beam deposition method on freshly cleaved graphite that produces large, uniformly ...

Ames crater under Oklahoma has been shown to be nearly 100 million years younger than thought, and is now dated at 370 ...

There are many ways to observe mitochondria now, aren't there? But in reality, every technique inevitably has some trade-offs ...

Pinshane Y. Huang, Racheff Faculty Scholar in the Department of Materials Science and Engineering at the University of ...

Missing animals in exceptionally preserved rocks expose uncertainty in the fossil constraints used to date the animal kingdom.

TCT speaks to Paul Brackman, X-ray Product Manager for ZEISS Research & Quality Solutions USA, about how ZEISS is supporting ...

Kagome superconductor physics advances: physicists identify a chiral electron parent state in CsV3Sb5 that forms above 174 K and seeds chirality in both the charge density wave and superconducting ...

A new study shows that the fire suppression method used to cool burning concrete dramatically affects how much strength the ...

Twisted bilayer WSe2 topology researchers at Beijing Normal University have directly imaged the atomic-scale mechanism that programs Hall current direction in quantum materials. Using scanning ...